Start typing and press Enter to search

This website does not support Internet Explorer. For a correct visualization we recommend to use Microsoft Edge or Google Chrome.

ISO 25178 STANDARD

ISO STANDARD

Surface texture characterization

The ISO 25178: Geometric Product Specifications (GPS) – Surface texture: areal standard is an International Organization for Standardization collection of international standards relating to the analysis of 3D areal surface texture. It is the first international standard taking into account the specification and measurement of 3D surface texture, and in particular defines 3D surface texture parameters and the associated specification operators.

The ISO 25178: Geometric Product Specifications (GPS) – Surface texture: areal standard is an International Organization for Standardization collection of international standards relating to the analysis of 3D areal surface texture. It is the first international standard taking into account the specification and measurement of 3D surface texture, and in particular defines 3D surface texture parameters and the associated specification operators.

ISO 25178 standard 3D areal surface texture

In general terms, both natural and manufactured surfaces comprise a primary shape or form, with varying degrees of structure, waviness and roughness (2D/3D). All of these surface features will contain both intentional and unintentional (controlled/uncontrolled) contributions.

The relative significance of these contributions is determined by the application (noting that uncontrolled contributions are not necessarily undesirable). The goal of a measurement is to evaluate – qualify and quantify – the differing contributions, either in support of a fundamental scientific research finding, or with regard to a target industrial application.

Depending on the field or application, the structure, waviness and roughness contributions might be categorized as finish, haptic, texture, defects, marks, micro-wear and much more. Alternatively, the user may be looking to determine critical dimensions, step-height, peak-to-valley, volume or slope, or even map coating thickness and other surface characteristics.

In general terms, both natural and manufactured surfaces comprise a primary shape or form, with varying degrees of structure, waviness and roughness (2D/3D). All of these surface features will contain both intentional and unintentional (controlled/uncontrolled) contributions.

The relative significance of these contributions is determined by the application (noting that uncontrolled contributions are not necessarily undesirable). The goal of a measurement is to evaluate – qualify and quantify – the differing contributions, either in support of a fundamental scientific research finding, or with regard to a target industrial application.

Depending on the field or application, the structure, waviness and roughness contributions might be categorized as finish, haptic, texture, defects, marks, micro-wear and much more. Alternatively, the user may be looking to determine critical dimensions, step-height, peak-to-valley, volume or slope, or even map coating thickness and other surface characteristics.

If the goal is to determine areal (3D) surface texture, the results can also be rigorously tied to the appropriate parameters as defined by the increasingly prevalent ISO 25178 standard. In industrial (surface) manufacturing, the adoption of best practices tied to widely accepted standards can make manufacturing more efficient, reproducible and traceable.

Typical applications sectors include general scientific and materials research, automotive, aerospace, consumer electronics, medical technology, tooling and optics & optoelectronics. Specific applications include additive manufacturing, laser, medical implants, molding, optical components, PCB, semiconductors, toolmarks, nano-technology, micromanufacturing, optics.

The sheer breadth of 3D surface and 2D profile metrology tasks across so many scientific and industrial applications points directly to the outright practicality of Sensofar Metrology’s ‘4-in-1’ approach.

SURFACE FILTERING

Terms, definitions and surface texture parameters

For surface texture characterization, filtering is essential to select your scale of interest. The following schemes are based on the definitions included in ISO 25178 part 2 regarding the different types of filters, operators and surfaces applied to areal measurements.

ISO 25178 standard 3D areal surface texture
Sensofar ISO Process
logo-sensoview_sneox_100x100
logo-sensoview_sneox_100x100

SensoVIEW is an advanced analysis software including surface and profile filtering tools according to ISO standards, being able to select the desired filters and nesting indexes.

SensoVIEW is an advanced analysis software including surface and profile filtering tools according to ISO standards, being able to select the desired filters and nesting indexes.

ALGORITHMS

Metrological characteristics for areal-topography measuring methods

All Sensofar developed technologies have been implemented and fulfill the criteria of ISO 25178 part 6 defined as metrological characteristics for areal-topography measuring methods.

All Sensofar developed technologies have been implemented and fulfill the criteria of ISO 25178 part 6 defined as metrological characteristics for areal-topography measuring methods.

Sensofar measuring methods
Traceability

TRACEABILITY

Calibration of surface texture measuring instruments

All our systems are manufactured to deliver accurate and traceable measurements. Systems are calibrated using traceable standards following the ISO 25178 guidelines of part 7 for: Z amplification factor, XY lateral dimensions, flatness error, as well as parcentricity and parfocality.

Sensofar ISO membership

ISO logo
ISO logo

Since 2007, Sensofar has been member of the Technical Committee of the International organization for Standardization (ISO/TC213) and has been deeply collaborating in the creation of the ISO 25178 standard.

Sensofar ISO linia temporal

Highlighted contents ISO 25178
Part 2: Terms, definitions and roughness parameters
Part 3: Specification operators -filters