S neox Grand Format, application notes and publications

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Documentation

S neox Grand Format Leaflet

Applications

Our products are designed to solve inspection requirements in the field of semiconductors, microelectronics, optics, and surface finishing. Covering the large markets of advanced manufacturing and consumer electronics.

Display

PCB

Semiconductors

Case Studies

In-situ metrology for pad surface monitoring in CMP

17 April, 2023 Case study, CMP, Consumer Electronics

The need for surface metrology for the CMP process is evident given that mechanical interaction between the surfaces is a critical variable for all stages of the process. The surfaces that need [...]

Roughness characterization of Virgo IMC instrumented baffle

15 March, 2023 Case study, Optical components, Optics

Characterizing the temperature-induced evolution of the shape and texture of a silicon wafer

2 June, 2021 Case study, Consumer Electronics, Semiconductors

Characterization of surfaces that generate structural color by total internal reflection

10 February, 2021 Advanced Manufacturing, Case study, Optical components

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Documentation

S neox Grand Format Leaflet

Applications

Display

PCB

Semiconductors

Case Studies

In-situ metrology for pad surface monitoring in CMP

Roughness characterization of Virgo IMC instrumented baffle

Characterizing the temperature-induced evolution of the shape and texture of a silicon wafer

Characterization of surfaces that generate structural color by total internal reflection

Get answers to your questions! Connect with an expert

Just write us an email or search for a direct contact near you.

Get answers to your questions! Connect with an expert

Just write us an email or search for a direct contact near you.

Get answers to your questions!
Connect with an expert

Just write us an email or search for
a direct contact near you.

Get answers to your questions!
Connect with an expert

Just write us an email or search for
a direct contact near you.