Presenting cutting-edge scientific papers at SPIE Photonics EU 24
We are proud to highlight the debut of two innovative research papers by our colleagues, Lena Zhukova and Narcís Vilar, at the SPIE Photonics Europe event held in Strasbourg this year. These papers, “Suppression of scanning nonlinearities through computational self-correction in optical” by Lena Zhukova and “Implementations of ESFS for fast topographic acquisition” by Narcís Vilar, are set to make significant contributions to the field of optical metrology.
Suppression of scanning nonlinearities through computational self-correction in optical profilometry
Author(s): Lena Zhukova, Sensofar-Tech, S.L. (Spain); Roger Artigas, Sensofar-Tech, S.L. (Spain); Guillem Carles Santacana, Sensofar-Tech, S.L. (Spain)
10 April 2024 • 12:00 – 12:20 CEST | Rome/Salon 5, Niveau/Level 0
Lena Zhukova’s research introduces a novel computational technique aimed at correcting scanning nonlinearities in optical profilometry. By leveraging a unique algorithm that processes the data from two distinct topographic measurements obtained in a single scan, this method effectively minimizes errors caused by the scanning stage’s non-linear movement. This approach promises to significantly improve the accuracy of optical profilometry measurements, offering a cost-effective solution to enhance the technology’s reliability and efficiency in various applications.
Implementations of ESFS for fast topographic acquisition
Author(s): Narcís Vilar, Sensofar-Tech, S.L. (Spain); Roger Artigas, Sensofar-Tech, S.L. (Spain); Martí Duocastella, Univ. de Barcelona (Spain); Guillem Carles Santacana, Sensofar-Tech, S.L. (Spain)
10 April 2024 • 16:20 – 16:40 CEST | Rome/Salon 5, Niveau/Level 0
Conversely, Narcís Vilar’s paper delves into the advancements in topographic acquisition through the implementation of Encoded Search Focal Scan (ESFS), a new technique invented and developed by Sensofar’s research team in collaboration with the University of Barcelona. The new technology enables the measurement of samples at high speeds (up to the millisecond time scales), which, combined with the possibility of scanning very large axial ranges, represents an unprecedented capacity for surface measurement, paving the way for broader scientific and industrial applications.
The SPIE Photonics Europe event, celebrated for its presentation of the latest breakthroughs in photonics and related areas, offers an unparalleled opportunity for Lena and Narcís to disseminate their groundbreaking research to an international audience. We commend their significant achievements and anticipate the considerable influence their research will exert on metrology.
