SENSOFAR PUBLIKATIONEN
Publikationen
Nicolas Galy, N. Toulhoat, N. Moncoffre, Y. Pipon, N. Bererd, M.R. Ammar, P. Simon, Damien Deldicque, Laurent Gremillard - Journal of Nuclear Materials Volume 502, Pages 20-29
Sergio Baragetti, Emanuele Borzini, Zeljko Bozic, Emanuele Vincenzo Arcieri - Engineering Failure Analysis Volume 102, Pages 219-225
Ying Zhang, Yan Chen, Hui Fan - Colloids and Surfaces A Physicochemical and Engineering Aspects Volume 419, Pages 1-6
Xiaowei Wang, Yi Tang, Biao Zhao, Tao Chen, Wenfeng Ding, Jiuhua Xu - Research Square (Research Square) Volume None
Maria Aymerich, Ezequiel Alvarez, Carmen Bao, Isabel Moscoso, Jose Ramon GonzalezJuanatey, M. T. Flores-Arias - Biofabrication Volume 9, Pages 025033-025033
M.P. Fiorucci, Ana Jesus Lopez Diaz, A. Ramil, J.S. PozoAntonio, T. Rivas - Applied Surface Science Volume 278, Pages 268-272
Jonas Skovlund Madsen, PoulErik Hansen, Pierre Boher, Deepak Dwarakanath, Jan Friis Jrgensen, Brian Bilenberg, Jesper Nygard, Morten Hannibal Madsen - Journal of Micro and Nano-Manufacturing Volume 5
Andreas Rank, Valentin Lang, Andres Fabian Lasagni - Advanced Engineering Materials Volume 19
Marius Navickas, Robertas Grigutis, Vytautas Jukna, G. Tamosauskas, A. Dubietis - Scientific Reports Volume 12
Yuanyuan Zhan, Dirk J. Broer, Danqing Liu - Advanced Materials Volume 35
Pablo Zuluaga-Ramirez, Malte Frovel, T. Belenguer, F. Salazar - Materials Volume 8, Pages 7524-7535
Bogdan Voisiat, Stephan Milles, Andres Fabian Lasagni - Journal of Laser Micro/Nanoengineering Volume None
Daan van den Ende, H. J. van de Wiel, Roel Kusters, Ashok Sridhar, Jeroen Schram, Maarten Cauwe, J. van den Brand - Microelectronics Reliability Volume 54, Pages 2860-2870
Jing Yuan, Y.H. Gao, Jihui Wang, Wenbin Hu - Materials and Corrosion Volume 68, Pages 1377-1388
Khodor I. Nasser, Jose M. Lineira del Rio, Enriqueta R. Lopez, Josefa Fernandez - Journal of Molecular Liquids Volume 311, Pages 113343-113343
