SENSOFAR PUBLIKATIONEN
Publikationen
XingJiu Huang, Leigh Aldous, Aoife OMahony, F. Javier del Campo, Richard G. Compton - Analytical Chemistry Volume 82, Pages 5238-5245
J.S. Pozo-Antonio, Laura Lopez, Amelia Dionisio, T. Rivas - Coatings Volume 8, Pages 335-335
LuQi Tao, Kunning Zhang, He Tian, Ying Liu, Dan-Yang Wang, Chen Yuan-Quan, Yi Yang, Houfang Liu - ACS Nano Volume 11, Pages 8790-8795
Shuai Ma, Qian Tang, Changbao Zhu, Fuyou Wang, Qixiang Feng, Jun Ho Song, Rossitza Setchi, Chenglong Ma, Ran Tao - Chinese Journal of Mechanical Engineering Additive Manufacturing Frontiers Volume 1, Pages 100051-100051
Tuo Liu, Suwan Sun, You Gao, Siyu Wang, Yongyuan Chu, Hairun Guo - Photonics Research Volume 10, Pages 2866-2866
Kamil Leksycki, E. Feldshtein - The International Journal of Advanced Manufacturing Technology Volume 126, Pages 5487-5499
Pavol Hvizdos, Priit Kulu, Michal Besterci - Key engineering materials Volume 527, Pages 191-196
Orsolya Tapaszto, Jan Balko, Viktor Puchy, Peter Kun, Gergely Dobrik, Zsolt Fogarassy, Zsolt Endre Horvath, Jan Dusza, Katalin Balazsi, Csaba Balazsi, Levente Tapaszto - Scientific Reports Volume 7
Muhammad Hazak Arshad, Xiaolei Chen, R. Neal Smith, Jun Qian, Dominiek Reynaerts - International Journal of Electrical Machining Volume 27, Pages 16-16
Shufen Tsoi, Dirk J. Broer, C.W.M. Bastiaansen, Michael G. Debije - Optics Express Volume 18, Pages A536-A536
Lucia Lizzul, Marco Sorgato, Rachele Bertolini, Andrea Ghiotti, Stefania Bruschi - Procedia CIRP Volume 102, Pages 228-233
Long Ye, Jun Qian, Han Haitjema, Dominiek Reynaerts - Measurement Volume 216, Pages 112995-112995
Pietro Benettoni, Hryhoriy Stryhanyuk, Stephan Wagner, Felix Kollmer, Jairo Hernan Moreno Osorio, Matthias Schmidt, Thorsten Reemtsma, Hans H. Richnow - Journal of Analytical Atomic Spectrometry Volume 34, Pages 1098-1108
Max Schneckenburger, Sven Hofler, Luis Carlos Florez Garcia, Rui Almeida, Rainer Borret - SN Applied Sciences Volume 4
Jun Wang, Jun Qian, Eleonora Ferraris, Dominiek Reynaerts - Procedia CIRP Volume 42, Pages 656-661
